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Elevating Quantum Well Precision with Atom Probe Tomography (APT) – Application note

星期一, 四月 28, 2025

In the quest to create isolated and controllable quantum systems within condensed matter, understanding material properties at the atomistic scale is crucial. Key performance parameters, such as quantum sensor sensitivities and qubit fidelities, are intricately linked to nanoscale properties. Our recent study leverages Atom Probe Tomography (APT) to provide unprecedented insights into these properties within a semiconductor heterostructure.

Key APT Insights:
  • Detailed Profiling: APT reveals Ge segregation during epitaxy, providing a detailed compositional profile not achievable with other methods.
  • Enhanced Qubit Operation: The profile enhances valley splitting in the conduction band, crucial for efficient spin qubit operation.
  • Superior Isotope Purification: Achieving 50 ppm of 29Si, APT minimizes qubit decoherence, outperforming current devices.
APT’s detailed insights are pivotal in advancing quantum computing, enhancing our understanding of critical parameters like valley splitting and qubit fidelity. Discover how APT is shaping the future of quantum technology.

This application note was written by Dominique Bougeard (Universität Regensburg, Germany) and Oana Cojocaru-Mirédin (RWTH Aachen University and INATECH, Albert-Ludwigs-Universität Freiburg, Germany).


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